JPH05850B2 - - Google Patents
Info
- Publication number
- JPH05850B2 JPH05850B2 JP57214953A JP21495382A JPH05850B2 JP H05850 B2 JPH05850 B2 JP H05850B2 JP 57214953 A JP57214953 A JP 57214953A JP 21495382 A JP21495382 A JP 21495382A JP H05850 B2 JPH05850 B2 JP H05850B2
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- base
- region
- stage
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims description 5
- 239000000758 substrate Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 13
- 230000003071 parasitic effect Effects 0.000 description 10
- 230000000903 blocking effect Effects 0.000 description 4
- 230000006378 damage Effects 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 101100316018 Arabidopsis thaliana UGE4 gene Proteins 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 101150056994 reb1 gene Proteins 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
- H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
- H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]
- H10D62/106—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] having supplementary regions doped oppositely to or in rectifying contact with regions of the semiconductor bodies, e.g. guard rings with PN or Schottky junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/30—Devices controlled by electric currents or voltages
- H10D48/32—Devices controlled by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H10D48/34—Bipolar devices
- H10D48/345—Bipolar transistors having ohmic electrodes on emitter-like, base-like, and collector-like regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
- H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
- H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/177—Base regions of bipolar transistors, e.g. BJTs or IGBTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/641—Combinations of only vertical BJTs
- H10D84/642—Combinations of non-inverted vertical BJTs of the same conductivity type having different characteristics, e.g. Darlington transistors
Landscapes
- Bipolar Integrated Circuits (AREA)
- Bipolar Transistors (AREA)
- Amplifiers (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57214953A JPS59104165A (ja) | 1982-12-06 | 1982-12-06 | 電力用トランジスタ |
DE19833390378 DE3390378T1 (de) | 1982-12-06 | 1983-12-05 | Leistungstransistor |
PCT/JP1983/000426 WO1984002427A1 (fr) | 1982-12-06 | 1983-12-05 | Transistor de puissance |
US06/882,028 US4827322A (en) | 1982-12-06 | 1986-07-03 | Power transistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57214953A JPS59104165A (ja) | 1982-12-06 | 1982-12-06 | 電力用トランジスタ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59104165A JPS59104165A (ja) | 1984-06-15 |
JPH05850B2 true JPH05850B2 (en]) | 1993-01-06 |
Family
ID=16664292
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57214953A Granted JPS59104165A (ja) | 1982-12-06 | 1982-12-06 | 電力用トランジスタ |
Country Status (4)
Country | Link |
---|---|
US (1) | US4827322A (en]) |
JP (1) | JPS59104165A (en]) |
DE (1) | DE3390378T1 (en]) |
WO (1) | WO1984002427A1 (en]) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5023693A (en) * | 1989-06-06 | 1991-06-11 | Kabushiki Kaisha Toyoda Jidoshokki Seisakusho | Transistor with current sensing function |
US5111267A (en) * | 1989-09-29 | 1992-05-05 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device having a multilayer electrode structure and method for fabricating the same |
JPH05243259A (ja) * | 1992-03-03 | 1993-09-21 | Mitsubishi Electric Corp | バイポーラトランジスタ及びその製造方法並びにダーリントントランジスタ及びその製造方法 |
JPH10270567A (ja) * | 1997-03-21 | 1998-10-09 | Oki Electric Ind Co Ltd | トランジスタ保護素子 |
WO2004079789A2 (en) * | 2003-03-05 | 2004-09-16 | Rensselaer Polytechnic Institute | Interstage isolation in darlington transistors |
US20050155627A1 (en) * | 2004-01-21 | 2005-07-21 | Johnsondiversey, Inc. | Spill cleaning device with built-in squeegee |
US8232558B2 (en) | 2008-05-21 | 2012-07-31 | Cree, Inc. | Junction barrier Schottky diodes with current surge capability |
US9478537B2 (en) * | 2009-07-15 | 2016-10-25 | Cree, Inc. | High-gain wide bandgap darlington transistors and related methods of fabrication |
US9117739B2 (en) | 2010-03-08 | 2015-08-25 | Cree, Inc. | Semiconductor devices with heterojunction barrier regions and methods of fabricating same |
US8664665B2 (en) | 2011-09-11 | 2014-03-04 | Cree, Inc. | Schottky diode employing recesses for elements of junction barrier array |
US8618582B2 (en) | 2011-09-11 | 2013-12-31 | Cree, Inc. | Edge termination structure employing recesses for edge termination elements |
US8680587B2 (en) | 2011-09-11 | 2014-03-25 | Cree, Inc. | Schottky diode |
USD848384S1 (en) * | 2017-08-17 | 2019-05-14 | Epistar Corporation | Transistor |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1035727A (en) * | 1965-12-22 | 1966-07-13 | Standard Telephones Cables Ltd | Semiconductor devices |
JPS5619106B2 (en]) * | 1973-11-14 | 1981-05-06 | ||
JPS5925389B2 (ja) * | 1976-02-04 | 1984-06-16 | 三菱電機株式会社 | 半導体装置 |
JPS5296870A (en) * | 1976-02-10 | 1977-08-15 | Matsushita Electronics Corp | Darlington transistor |
US4136355A (en) * | 1976-02-10 | 1979-01-23 | Matsushita Electronics Corporation | Darlington transistor |
US4167748A (en) * | 1978-07-03 | 1979-09-11 | Bell Telephone Laboratories, Incorporated | High voltage monolithic transistor circuit |
JPS55158666A (en) * | 1979-05-29 | 1980-12-10 | Toshiba Corp | Semiconductor device |
JPS56101772A (en) * | 1980-01-17 | 1981-08-14 | Nippon Denso Co Ltd | Darlington transistor |
JPH0580777A (ja) * | 1991-09-20 | 1993-04-02 | Hitachi Ltd | 車室内騒音の能動消音装置 |
JP2964368B2 (ja) * | 1992-04-23 | 1999-10-18 | 株式会社 ジェイム | 雨洩り位置の探索方法 |
JPH05294779A (ja) * | 1992-04-23 | 1993-11-09 | Kawasaki Steel Corp | 単結晶引上装置 |
-
1982
- 1982-12-06 JP JP57214953A patent/JPS59104165A/ja active Granted
-
1983
- 1983-12-05 DE DE19833390378 patent/DE3390378T1/de not_active Ceased
- 1983-12-05 WO PCT/JP1983/000426 patent/WO1984002427A1/ja active Application Filing
-
1986
- 1986-07-03 US US06/882,028 patent/US4827322A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS59104165A (ja) | 1984-06-15 |
DE3390378T1 (de) | 1985-04-04 |
WO1984002427A1 (fr) | 1984-06-21 |
US4827322A (en) | 1989-05-02 |
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